Credits and Contact Hours

3 credits, 43 hours

Course Instructor Name

Dr. Mohammad Al-Failakawi and Dr. Mahmoud A. Bennaser

Textbook

Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits, M. Bushnell and V. Agrawal, 1st Edition

Catalog Description

The course encompasses the theoretical and practical aspects of digital systems testing and the design of easily testable circuits. Major topics include defect, fault modeling, test generation for combinational and sequential circuits, test measures and costs, functional and parametric test methods, single stuck-at model, design for testability, scan-path design, built-in self-tests, and concurrent testing. In addition, the course introduces students to ATPG tools and their usage in fault simulation, test, and diagnosis of combinational circuits.

Prerequisite

CpE-368

Specific Goals for the Course

Upon successful completion of this course, students will be able to:

Calculate the yield of a given manufacturing environment. (Student outcome: 1)

Ability to generate fault list of a given circuit and perform fault list collapsing using concepts of fault equivalence and dominance. (Student outcome: 1)

Perform manual fault simulation, test generation, as well finding testability measures of a given circuit. (Student outcomes: 1, 6)

Explain the differences between various scan-based design concepts.

Use ATPG tools in fault simulation, test, and diagnosis of combinational circuits. (Student outcomes: 1, 2, 6)

Topics to Be Covered

Test Economics

Fault Modeling

Logic and Fault Simulation

Testability measures

Combinational Circuit Test Generation

Sequential Circuit Test Generation

Design for testability and scan-based designs